Dr Campbell Millar
University of Glasgow
Device Modelling Group


List of Publications

    Please also see the department publications database.

  • J. Ding, P. Asenov, D. Reid, C. Millar and A. Asenov, "Statistical compact model extraction in the presence of BTI degradation," VARI 2012: June 10-11, 2012.

  • M. Merrett, P. Asenov, Y. Wang, M. Zwolinski, S. Roy, C. Millar and D. Reid, "Modelling Circuit Performance Variations due to Statistical Variability: Monte Carlo Static Timing Analysis," Design, Automation and Test in Europe: Mar. 14-18, 2011.

  • B. Cheng, N. Moezi, D. Dideban, C. Millar, S. Roy and A. Asenov, "Impact of Statistical Parameter Set Selection on Accuracy of Statistical Compact Modeling," MOS-AK Workshop: Sapienza Università di Roma, Apr. 8-9, 2010.

  • A. Asenov, B. Cheng, D. Dideban, U. Kovac, N. Moezi, C. Millar, G. Roy, A. R. Brown and S. Roy, "Modeling and Simulation of Transistor and Circuit Variability and Reliability," Custom Integrated Circuit Conference: San Jose, California, Sept. 19-22, 2010.

  • P. Asenov, D. Reid, C. Millar, S. Roy, Z. Liu, S. Furber and A. Asenov, "Generic Aspects of Digital Circuit Behaviour in the Presence of Statistical Variability," European Workshop on CMOS Variability: May 26, 2010.

  • P. Asenov, N. A. Kamsani, D. Reid, C. Millar, S. Roy and A. Asenov, "Combining Process and Statistical Variability in the Evaluation of the Effectiveness of Corners in Digital Circuit Parametric Yield Analysis," European Solid-State Circuits Conference: Sept. 13-17, 2010.

  • D. Reid, C. Millar, S. Roy and A. Asenov, "Understanding LER-Induced MOSFET VT Variability—Part II: Reconstructing the Distribution," IEEE Transactions on Electron Devices, Nov. 2010.

  • D. Reid, C. Millar, S. Roy and A. Asenov, "Understanding LER-Induced MOSFET VT Variability—Part I: Three-Dimensional Simulation of Large Statistical Samples," IEEE Transactions on Electron Devices, Nov. 2010.

  • I. Moore, C. Millar, S. Roy and A. Asenov, Eds., Integrating drift-diffusion and Brownian simulations for sensory applications, 2010, Ultimate Integration on Silicon, Mar. 17-19, 2010.

  • N. A. Kamsani, B. Cheng, C. Millar, N. Moezi, X. Wang, S. Roy and A. Asenov, "Impact of Slew Rate Definition on the Accuracy of nanoCMOS Inverter Timing Simulations," in Proc. Ultimate Integration on Silicon, Glasgow, Scotland, UK, Mar. 17-19, 2010,

  • D. Dideban, B. Cheng, N. Moezi, N. A. Kamsani, C. Millar, S. Roy and A. Asenov, "Impact of Input Slew Rate on Statistical Timing and Power Dissipation Variability in nano CMOS," in Proc. Ultimate Integration on Silicon, Glasgow, Scotland, UK, Mar. 17-19, 2010, pp. 45–48.

  • B. Cheng, D. Dideban, N. Moezi, C. Millar, G. Roy, X. Wang, S. Roy and A. Asenov, "Capturing Intrinsic Parameter Fluctuations using the PSP Compact Model," in Proc. Design, Automation and Test in Europe, Dresden, Germany, Mar. 8-12, 2010, pp. 650–653.

  • B. Cheng, D. Dideban, N. Moezi, C. Millar, G. Roy, X. Wang, S. Roy and A. Asenov, "Statistical Variability Compact Modeling Strategies for BSIM4 and PSP," IEEE Design and Test of Computers, Vol. 27, No. 2, pp. 26–35, Mar./Apr. 2010.

  • B. Cheng, S. Roy, A. R. Brown, C. Millar and A. Asenov, "Evaluation of statistical variability in 32 and 22 nm technology generation LSTP MOSFETs," Solid-State Electronics, Vol. 53, No. 7, pp. 767–772, July 2009.

  • D. Reid, R. O. Sinnott, C. Millar, G. Roy, S. Roy and G. Stewart, "Enabling Cutting-edge Semiconductor Simulation through Grid Technology," Journal of the Philosophical Transactions of the Royal Society A, January 2009. Jan. 2009.

  • D. Reid, C. Millar, G. Roy, S. Roy and A. Asenov, "Statistical enhancement of combined simulations of RDD and LER variability: What can simulation of a 10^5 sample teach us?" International Electron Devices Meeting 2009: Dec. 7-9, 2009.

  • D. Reid, C. Millar, G. Roy, S. Roy and A. Asenov, "Efficient Simulations of 6σ VT Distributions Due to Random Discrete Dopants," Proc. ULIS 2009: Mar. 2009.

  • D. Reid, C. Millar, G. Roy, S. Roy and A. Asenov, "Understanding LER-induced Statistical Variability: A 35,000 Sample 3D Simulation Study," Proc. ESSDERC 2009: Sept. 14-18, 2009.

  • D. Reid, C. Millar, G. Roy, S. Roy and A. Asenov, "Analysis of Threshold Voltage Distribution due to Random Dopants: A 100,000 Sample 3D Simulation Study," IEEE Transactions on Electron Devices, Oct. 2009.

  • A. Asenov, S. Roy, A. R. Brown, G. Roy, C. L. Alexander, C. Riddet, C. Millar, B. Cheng, A. Martinez, N. Seoane, D. Reid, M. Faiz. Bukhori, X. Wang and U. Kovac, "Advanced simulation of statistical variability and reliability in nano CMOS transistors," in Proc. IEDM, USA, Dec. 2008, p. 421.

  • B. Cheng, S. Roy, A. R. Brown, C. Millar and A. Asenov, "Statistical Variations in 32nm Thin-Body SOI Devices and SRAM Cells," Proc. ICSICT 2008: 2008.

  • B. Cheng, S. Roy, A. R. Brown, C. Millar and A. Asenov, "Evaluation of intrinsic parameter fluctuations in 45, 32 and 22 nm technology node LP n-MOSFETs," Proc. ESSDERC 2008: Sept. 15-19, 2008.

  • D. Reid, C. Millar, S. Roy, G. Roy, R. O. Sinnott, G. Stewart, G. Stewart and A. Asenov, "Enabling Cutting-Edge Semiconductor Simulation through Grid Technology," All Hands Meeting 2008: Sept. 2008.

  • U. Kovac, D. Reid, C. Millar, G. Roy, S. Roy and A. Asenov, "Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET," Microelectronics Reliability, Vol. 48, No. 8-9, pp. 1572–1575, 2008.

  • D. Reid, C. Millar, A. Asenov, S. Roy, G. Roy, R. O. Sinnott and G. Stewart, "Supporting Statistical Semiconductor Device Analysis using EGEE and OMII-UK Middleware," EGEE User Conference: Clermont-Ferrand, France, Feb. 2008.

  • R. O. Sinnott, A. Asenov and C. Millar, "Supercomputing at Work in the nanoCMOS Electronics Domain," ERCIM News, vol. 74, pp. 22–23, July 2008.

  • R. O. Sinnott, C. Bayliss, C. Millar, G. Stewart, G. Roy, S. Roy, D. Reid, B. Harbulot, C. Davenhall, A. Asenov and J. Watt, "Secure, Performance-Oriented Data Management for nanoCMOS Electronics," in Proc. e-Science 2008 Conference, Indiana, USA,

  • R. O. Sinnott, A. Asenov, C. Millar, D. Berry, B. Harbulot, D. Reid, G. Roy, S. Roy and G. Stewart, "Meeting the Design Challenges of nanoCMOS Electronics through Secure, Large-scale Simulation and Data Management," EGEE User Conference: Istanbul Turkey, Oct. 2008.

  • R. O. Sinnott, A. Asenov, C. Bayliss, C. Davenhall, T. Doherty, B. Harbulot, M. Jones, D. Martin, C. Millar, G. Roy, S. Roy, G. Stewart and J. Watt, "Integrating Security Solutions to Support nanoCMOS Electronics Research," IEEE International Symposium on Parallel and Distributed Processing Systems with Applications: Sydney, Australia, Dec. 2008.

  • C. Millar, D. Reid, G. Roy, S. Roy and A. Asenov, "Accurate Statistical Description of Random Dopant Induced Threshold Voltage Variability," IEEE Electron Device Letters, Vol. 29, No. 8, pp. 946–948, Aug. 2008.

  • D. Reid, S. Roy, C. Millar, G. Roy, R. O. Sinnott, G. Stewart and A. Asenov, "Supporting Statistical Semiconductor Analysis using EGEE and OMII-UK Middleware," EGEE 3rd User Forum: Feb. 2008.

  • D. Reid, C. Millar, S. Roy, R. O. Sinnott, G. Stewart, G. Stewart and A. Asenov, "Prediction of Random Dopant Induced Threshold Voltage Fluctuations in NanoCMOS Transistors," Simulation of Semiconductor Processes and Devices 2008: Sept. 9-11, 2008.

  • C. Millar, S. Roy, D. R. S. Cumming, T. D. Drysdale, S. Furber, D. Edwards, M. Zwolinski, A. M. Tyrrell, A. F. Murray, S. Pickles, R. O. Sinnott, D. Berry and A. Asenov, "Meeting the Design Challenges of nano-CMOS Electronics," Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test: Mar. 10-14, 2008.

  • S. Roy, C. Millar and A. Asenov, "Statistical Compact Modelling as a Tool in Understanding Circuit Variability," Design Automation and Test in Europe: Workshop W2, Impact of Process Variability on Design and Test: Mar. 10-14, 2008.

  • S. Roy, C. Millar and A. Asenov, "Impact of Device Variability on Design," Ultimate Limits of Integration in Silicon 2008: Mar. 12-14, 2008.

  • D. Reid, C. Millar, S. Roy, G. Roy, R. O. Sinnott, G. Stewart, G. Stewart and A. Asenov, "An Accurate Statistical Analysis of Random Dopant Induced Variability in 140,000 13nm MOSFETs," Silicon Nanoelectronics Workshop 2008: June 15-16, 2008.

  • C. Millar, R. Madathil, O. Beckstein, M. S. P. Sansom, S. Roy and A. Asenov, "Brownian simulation of charge transport in α-Haemolysin," Journal of Computational Electronics, 2008.

  • C. Millar, S. Roy, D. Cumming, T. Drysdale, S. Furber, D. Edwards, M. Zwolinski, A. Tyrrell, A. Murray, S. Pickles, R. O. Sinnott, D. Berry and A. Asenov, "Meeting the Design Challenges of Nano-CMOS Electronics," in Proc. Workshop on the Impact of Process Variability on Design and Test, Mar. 2008,

  • R. O. Sinnott, T. Doherty, D. Martin, C. Millar, G. Stewart and J. Watt, "Supporting Security-oriented, Collaborative nanoCMOS Electronics Research," in Proc. International Workshop on Computing Science, June 2008,

  • C. Millar, R. Madathil, O. Beckstein, M. S. P. Sansom, S. Roy and A. Asenov, "Brownian simulation of charge transport in alpha-haemolysin," 12th International Workshop on Computational Electronics: Oct. 8-10, 2007.

  • A. Asenov, C. Millar, S. Roy, D. R. S. Cumming, R. O. Sinnott, G. Stewart, A. F. Murray, D. Berry, A. M. Tyrrell, J. Hilder, S. Furber, S. Pickles, M. McKeown, M. Zwolinski and D. De Roure, "Meeting the Design Challenges of nano-CMOS Electronics," Third International Nanotechnology Conference on Communication and Cooperation: Apr. 16-17, 2007.

  • R. O. Sinnott, A. Asenov, A. R. Brown, C. Millar, S. Roy, G. Roy and G. Stewart, "Grid Infrastructures for the Electronics Domain: Requirements and Early Prototypes from an EPSRC Pilot Project," in Proc. UK e-Science All Hands Meeting, Nottingham, UK, 2007, pp. 509–516.

  • L. Han, R. O. Sinnott, G. Stewart, A. Asenov, S. Roy, G. Roy, C. Millar and D. Berry, "Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics," IEEE e-Science 2007 Conference: 2007.

  • A. Martinez, M. Bescond, J. R. Barker, A. Svizhenko, M. P. Anantram, C. Millar and A. Asenov, "A self-consistent full 3-D real-space NEGF simulator for studying nonperturbative effects in nano-MOSFETs," IEEE Transactions on Electron Devices, Vol. 54, No. 9, pp. 2213–2222, 2007.

  • C. Millar, S. Roy, O. Beckstein, M. S. P. Sansom and A. Asenov, "Continuum versus particle simulation of model nano-pores," Journal of Computational Electronics, Vol. 6, pp. 367–371, 2007.

  • C. Millar, S. Roy, A. R. Brown and A. Asenov, "Simulating the bio-nanoelectronic interface," Journal of Physics-Condensed Matter, Vol. 19, No. 21, 2007.

  • R. O. Sinnott, A. Asenov, D. Berry, S. Roy, S. Furber, D. R. S. Cumming, A. Tyrrell, A. F. Murray, M. Zwolinski, S. Pickles and C. Millar, "Meeting the Design Challenges of nanoCMOS Electronics: An Introduction to an EPSRC Pilot Project," in Proc. UK e-Science All Hands Meeting, Sept. 2006,

  • C. Millar, S. Roy and A. Asenov, "Simulation of Bio-Nano-CMOS devices," ser. E-MRS IUMRS ICEM 2006, Nice, France, p. i.

  • C. Millar, S. Roy, O. Beckstein, M. S. P. Sansom and A. Asenov, "Continuum versus particle simulation of model nano-pores," ser. 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria, p. 367.

  • C. Millar, S. Roy, O. Beckstein, M. S. P. Sansom and A. Asenov, "Continuum Vs. Particle Simulations of Model Nano-Pores," J. Computational Electronics, 2006.

  • C. Millar, A. Asenov and S. Roy, "P3M Modelling of Biological Systems," in Proc. E-MRS IUMRS ICEM 2006 Spring Meeting, Symposium Q, July.

  • C. Millar, A. Asenov and S. Roy, "Self-consistent particle simulation of ion channels," Journal of Computational and Theoretical Nanoscience, Vol. 2, No. 1, pp. 56–67, 2005.

  • C. Millar, A. Asenov, S. Roy and A. R. Brown, "Simulating the bio-nano-CMOS interface," ser. 5th IEEE conference on Nanotechnology, Nagoya, Japan,

  • C. Millar, A. Asenov, A. R. Brown and S. Roy, "Tracking the propagation of individual ions through nano-MOSFETs," J. Computational Electronics, Vol. 4, No. 1-2, pp. 185–188, Apr. 2005.

  • C. Millar and A. Asenov, "P3M Simulation of Biological Ion Channels," in Handbook of Theoretical and Computational Nanotechnology. American Scientific Publishers, 2005,

  • C. Millar, A. Asenov and S. Roy, "Simulating Ion Channels and their Nano-CMOS Interface," in Proc. U.K.-Korea Joint Symposium on Bio-Technology, Feb.

  • C. Millar, A. Asenov, A. R. Brown and S. Roy, "Tracking the propagation of individual ions through ion channels with nano-MOSFETs," in Proc. 10th International Workshop on Computational Electronics (IWCE), ser. International workshop on Computational Electronics, IWCE-10, West Lafayette, IN, USA, Oct. 24-27, 2004, pp. 205–206.

  • C. Millar, "3D Simulation Techniques For Biological Ion Channels," thesis thesis, University of Glasgow, Glasgow, 2004.

  • C. Millar, A. Asenov and S. Roy, "Brownian ionic channel simulation," in Proc. International Workshop on Computational Electronics, Champaign Urbana, USA,

  • C. Millar, A. Asenov and S. Roy, "Brownian dynamics based particle mesh simulation of ionic solutions and channels," ser. Proceedings Modeling and Simulation of Microsystems 2003 - MSM 03,

  • C. Millar and A. Asenov, "Modelling Ion Channels: The Engineers Approach," in Proc. IOP Electrostatics 2003, Abstracts, Mar.

  • C. Millar, A. Asenov and S. Roy, "Brownian ionic channel simulation," Journal of Computational Electronics, Vol. 2, pp. 257–262, 2003.

  • C. Millar, A. Asenov and S. Roy, "Brownian Dynamics Based Simulation Of Ionic Solutions And Channels," in Proc. Nanotech 2003: Technical Proceedings, Cambridge,

  • C. Millar, A. Asenov and J. R. Watling, "Excessive Over-Relaxation Method For Multigrid Poisson Solvers," J. Computational Electronics, Vol. 1, No. 3, pp. 341–345, 2002.

  • C. Millar, A. Asenov and S. Roy, "A Generic Particle-Mesh Framework For The Simulation Of Ionic Channels," J. Computational Electronics, Vol. 1, No. 3, pp. 405–409, 2002.

  • C. Millar and A. Asenov, "Multiscale Particle-Mesh Ion Channel Simulations," in Proc. Workshop on Ion Channels,

  • C. Millar, A. Asenov, S. Roy and J. M. Cooper, "Generic Particle-Mesh Framework for the Simulation of Ionic Channels," in Proc. Proceedings of the International Workshop on Computational Electronics IWCE01,

Last Updated June 10 2010.